Intellectual Property India Publishes Patent Application for A Forensic Image-Based Anthropometric Measurement Framework With Landmark-Guided Scale Normalization From A 2d Image

MUMBAI, India, Sept. 28 -- Intellectual Property India has published a patent application (202621046344 A) filed by National Forensic Sciences University on April 10, 2026, for A Forensic Image-Based Anthropometric Measurement Framework With Landmark-Guided Scale Normalization From A 2d Image.

Inventors include Paheli Sharma; Saurabh Ratiram Patil; Vishal Arvindlal Mevada; Gargi Jani; Hardi Mendpara; Bhargav C. Patel; and Malay A. Shukla.

The application for the patent was published on September 25, 2026, under issue no. 39/2026.

Abstract: ABSTRACT A forensic image-based anthropometric measurement framework with landmark-guided scale normalization from a 2D image The present invention relates to a forensic image-based anthropometric meas...