MUMBAI, India, June 24 -- Intellectual Property India has published a patent application (202421096302 A) filed by Ruturaj Puranik on December 06, 2024, for 3d Reflectance Measurement System.
Inventors include Ruturaj Puranik; Ganesh Pawar; Pranav Govekar; Payal Deshmukh; Dr. Nilima Warade; and Dr. Pradeep Mane.
The application for the patent was published on June 12, 2026, under issue no. 24/2026.
Abstract: A 3D reflectance measurement instrument is critical for accurately modelling material interactions with light, essential for enhancing realism in computer vision applications in gaming. This instrument captures comprehensive reflectance data by measuring the Bidirectional Reflectance Distribution Function (BRDF) and Bidirectional Tex...