Intellectual Property India Publishes Patent Application for 'System And Method For Grain Quality Assessment' Filed by Aryatech Platforms Private Limited

MUMBAI, India, Feb. 13 -- Intellectual Property India has published a patent application (202511129085 A) filed by Aryatech Platforms Private Limited, Noida, Uttar Pradesh, on Dec. 19, 2025, for 'system and method for grain quality assessment.'

Inventor(s) include Rao, Margapuri Prasanna; Kumar, Sameer; Chandra, Anand; Rai, Navneet Kumar; Gattyani, Vaibhav; and Singh, Ankesh Kumar.

The application for the patent was published on Feb. 13, under issue no. 07/2026.

According to the abstract released by the Intellectual Property India: "The present disclosure relates to a system (102) and a method (300) for grain quality assessment. The system (102) receives images of grains using sensors, detects features of each of the grains from the rece...