MUMBAI, India, April 17 -- Intellectual Property India has published a patent application (202641042547 A) filed by Sr University, Warangal, Telangana, on April 2, for 'system and method for accurate and robust detection of wheat leaf diseases using optimized deep learning and adaptive image intelligence.'
Inventor(s) include Narendra Pal Singh Rathore; and Dr. Rupesh Kumar Mishra.
The application for the patent was published on April 17, under issue no. 16/2026.
According to the abstract released by the Intellectual Property India: "The present invention discloses a system and method for detecting AI-generated and digitally doctored images using a hybrid approach that integrates image forensic analysis with deep learning-based classific...