Intellectual Property India Publishes Patent Application for 'Intelligent Nuchal Translucency Measurement And Risk Assessment System For Early Genetic Disorder Screening' Filed by Smita Satish Pawar; Dr. Mangesh Dindayal Nikose; and Dr. Anni Udaybhan Gupta

MUMBAI, India, Feb. 27 -- Intellectual Property India has published a patent application (202621004993 A) filed by Smita Satish Pawar; Dr. Mangesh Dindayal Nikose; and Dr. Anni Udaybhan Gupta, Pune, Maharashtra, on Jan. 19, for 'intelligent nuchal translucency measurement and risk assessment system for early genetic disorder screening.'

Inventor(s) include Smita Satish Pawar; Dr. Mangesh Dindayal Nikose; and Dr. Anni Udaybhan Gupta.

The application for the patent was published on Feb. 27, under issue no. 09/2026.

According to the abstract released by the Intellectual Property India: "The present invention discloses an Intelligent Nuchal Translucency Measurement and Risk Assessment System for Early Genetic Disorder Screening comprising an...