Intellectual Property India Publishes Patent Application for 'An Automated Conveyor-Based Textile Inspection System Integrating Deep Learning Defect Detection And Color Analysis' Filed by Thapar Institute Of Engineering And Technology

MUMBAI, India, March 13 -- Intellectual Property India has published a patent application (202611010265 A) filed by Thapar Institute Of Engineering And Technology, Patiala, Punjab, on Jan. 31, for 'an automated conveyor-based textile inspection system integrating deep learning defect detection and color analysis.'

Inventor(s) include Amitesh Sharma; Jayant Singh; Jigyasha Gangwal; Manini Vidyarthi; Varun Thakur; Garima Singh; and Sonu Lamba.

The application for the patent was published on March 13, under issue no. 11/2026.

According to the abstract released by the Intellectual Property India: "An Automated Conveyor-Based Textile Inspection System (100) Integrating Deep Learning Defect Detection and Colour Analysis. The system comprising ...