MUMBAI, India, May 1 -- Intellectual Property India has published a patent application (202641050564 A) filed by Easwari Engineering College, Chennai, Tamil Nadu, on April 21, for 'al-based automated defective exhibit identification system placed in a gallery.'
Inventor(s) include Yuvaraj R; Saravana Dhinesh N; and Saranya S.
The application for the patent was published on May 1, under issue no. 18/2026.
According to the abstract released by the Intellectual Property India: "The Artificial Intelligence for Defective Exhibit Identification System is a sophisticated, automated framework engineered to safeguard gallery environments through advanced computer vision. By leveraging deep learning-based image classification and specialized anoma...