MUMBAI, India, May 29 -- Intellectual Property India has published a patent application (202641064473 A) filed by Vellore Institute Of Technology, Vellore, Tamil Nadu, on May 21, for 'a closed-loop radiographic inspection system and method for defect detection and depth estimation.'
Inventor(s) include Dr. Priya V; Sanjay Kanna V; Mohammed Arfath R; Gopi C K; Gokul Kanna V; Naresh R; and Sheeba S.
The application for the patent was published on May 29, under issue no. 22/2026.
According to the abstract released by the Intellectual Property India: "The present invention relates to a closed-loop radiographic inspection system (100) and a corresponding method (200) for defect detection and depth estimation in non-destructive testing. The sy...