ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,769, issued on April 14, was assigned to HAMILTON SUNDSTRAND Corp. (Charlotte, N.C.). "Input isolated voltage monitor" was invented by Nag... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,770, issued on April 14, was assigned to SIGMASTAR TECHNOLOGY LTD. (Xiamen, China). "Voltage detector device having trimming mechanism and... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,771, issued on April 14, was assigned to Wago Verwaltungsgesellschaft mbH (Minden, Germany). "Sensor device for an electrical terminal arr... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,772, issued on April 14, was assigned to Jilin University (Changchun City, China). "Energy consumption decomposition method of electric ve... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,773, issued on April 14, was assigned to SHENZHEN GOODIX TECHNOLOGY Co. LTD. (Guangdong, China). "Detection circuit and related electronic... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,774, issued on April 14, was assigned to INVENSENSE INC. (San Jose, Calif.). "Low noise readout interface for capacitive sensors with nega... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,775, issued on April 14, was assigned to CEYEAR TECHNOLOGIES Co. LTD. (Qingdao, China). "Method and system for testing conversion losses o... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,776, issued on April 14, was assigned to Qualtec Co. Ltd. (Osaka-fu, Japan). "Power-semiconductor-device test apparatus facilitating test-... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,777, issued on April 14, was assigned to Industrial Technology Research Institute (Hsinchu, Taiwan). "Inspection system and method for ins... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,778, issued on April 14, was assigned to SK HYNIX INC. (Icheon-si, South Korea) and FEMTOMETRIX INC. (Los Angeles). "Field-biased nonlinea... Read More