ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,779, issued on May 5, was assigned to Genentech Inc. (South San Francisco, Calif.). "Fluorescent ellman assay for free thiol detection" was i... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,781, issued on May 5, was assigned to Gumersindo Martinez (Centerton, Ark.). "System and methods for detecting mattress defects" was invented... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,782, issued on May 5, was assigned to AVer Information Inc. (New Taipei City, Taiwan). "Automatic food inspection device" was invented by Hun... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,783, issued on May 5, was assigned to HITACHI GE VERNOVA NUCLEAR ENERGY LTD. (Ibaraki, Japan). "Pipe inspection method" was invented by Masah... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,784, issued on May 5, was assigned to THE TRUSTEES OF DARTMOUTH COLLEGE (Hanover, N.H.). "Systems and methods for non-invasive microwave test... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,785, issued on May 5, was assigned to QUAESTA INSTRUMENTS LLC (Tucson, Ariz.). "Systems and methods of cosmic ray sensing of soil moisture fo... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,786, issued on May 5, was assigned to SHIMADZU Corp. (Kyoto, Japan). "X-ray imaging apparatus" was invented by Ryo Fujita (Kyoto, Japan), Hir... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,787, issued on May 5, was assigned to ANRITSU Corp. (Kanagawa, Japan). "X-ray inspection apparatus and X-ray inspection system" was invented ... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,788, issued on May 5, was assigned to ETROLOGY LLC (Ore.). "System and method for denoising a region of interest of a pattern" was invented b... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,789, issued on May 5, was assigned to FUJIFILM Corp. (Tokyo). "Infrared thermal image analysis device, infrared thermal image analysis method... Read More