ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,250, issued on Nov. 11, was assigned to Stud Connector (IP) Ltd. (London). "Stud frame connector" was invented by Nigel Paul Conybeare (Tri... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,574, issued on Nov. 11, was assigned to North University of China (Taiyuan, China). "Deformable tracked pipeline robot and differential tur... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,468,925, issued on Nov. 11, was assigned to The Regents of The University of California (Oakland, Calif.). "Self-organizing logic gates and cir... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,465,524, issued on Nov. 11, was assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT Co. LTD. (Osaka, Japan). "Ear-worn device and reproducti... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,176, issued on Nov. 11, was assigned to Korea Advanced Institute of Science and Technology (Daejeon, South Korea) and AMOREPACIFIC Corp. (Se... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,118, issued on Nov. 11, was assigned to Deere & Co. (Moline, Ill.). "System and method for measuring leaf-to-stem ratio" was invented by Ma... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,268, issued on Nov. 11, was assigned to NEC Corp. (Tokyo). "Method, device and computer storage medium for data analysis" was invented by N... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,468,063, issued on Nov. 11, was assigned to Analogic Corp. (Peabody, Mass.). "Apparatus for vertical screening" was invented by Sevag Zoboyan (... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,470,669, issued on Nov. 11. "Systems, methods, and media for video calling based on GPS location" was invented by Jose Gonzalez (Davie, Fla.). ... Read More
ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,676, issued on Nov. 11, was assigned to Buhler Alzenau GmbH (Alzenau, Germany). "In-situ etch rate or deposition rate measurement system" w... Read More