ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,799, issued on April 14, was assigned to MIM SOFTWARE INC. (Cleveland). "Registration chaining with information transfer" was invented by ... और पढ़ें
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,800, issued on April 14, was assigned to SUMITOMO RUBBER INDUSTRIES LTD. (Kobe, Japan). "Tire state estimation method" was invented by Mar... और पढ़ें
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,801, issued on April 14, was assigned to Sony Semiconductor Solutions Corp. (Kanagawa, Japan). "Image processing circuitry and image proce... और पढ़ें
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,802, issued on April 14, was assigned to ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE (Daejeon, South Korea). "Electronic device ... और पढ़ें
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,803, issued on April 14, was assigned to HTC Corp. (Taoyuan City, Taiwan). "Head-mounted display and method for depth prediction" was inve... और पढ़ें
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,804, issued on April 14, was assigned to SHINING 3D TECH Co. LTD. (Hangzhou, China). "Method for processing three-dimensional scanning, th... और पढ़ें
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,805, issued on April 14, was assigned to Adeia Guides Inc. (San Jose, Calif.). "Data transmission throttling and data quality updating for... और पढ़ें
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,806, issued on April 14, was assigned to University of Maryland, College Park (College Park, Md.). "Systems and methods for machine vision... और पढ़ें
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,808, issued on April 14, was assigned to General Electric Co. (Schenectady, N.Y.) and Oliver Crispin Robotics Ltd. (Altrincham, Great Brita... और पढ़ें
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,809, issued on April 14, was assigned to SHENZHEN SIBRIGHT TECHNOLOGY Co. LTD. (Shenzhen, China). "Measuring method and measuring apparatu... और पढ़ें