ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,472,873, issued on Nov. 18, was assigned to TOYOTA JIDOSHA K.K. (Toyota, Japan). "Monitoring device" was invented by Yuko Mizuno (Nagoya, Japan... Read More
ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,477,728, issued on Nov. 18, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor memory device and method of ma... Read More
ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,477,832, issued on Nov. 18, was assigned to NUVOTON TECHNOLOGY Corp. (Hsinchu Science Park, Taiwan). "Semiconductor device and semiconductor st... Read More
ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,477,736, issued on Nov. 18, was assigned to SK hynix Inc. (Icheon-si, South Korea). "Semiconductor device and manufacturing method of semicondu... Read More
ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,472,061, issued on Nov. 18, was assigned to EDWARDS LIFESCIENCES Corp. (Irvine, Calif.). "Systems, devices, and methods for treating heart valv... Read More
ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,472,444, issued on Nov. 18, was assigned to LoveFrom Inc. (San Francisco). "Bistable pivot hinge" was invented by Patrick Kessler (San Francisc... Read More
ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,093, issued on Nov. 18, was assigned to SENCERA ENERGY INC. (Charlotte, N.C.). "Stirling device" was invented by Russell Jewett (Lake Wylie... Read More
ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,473,748, issued on Nov. 18. "Segmented lock pin" was invented by Jeffrey Scott Leaning (Arlington, Va.). According to the abstract* released b... Read More
ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,475,222, issued on Nov. 18, was assigned to Crowdstrike Inc. (Sunnyvale, Calif.). "Method and apparatus for mapping similarity spaces" was inve... Read More
ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,399, issued on Nov. 18, was assigned to NXP B.V. (Eindhoven, Netherlands). "Analog test devices for integrated circuits with multiple power... Read More