ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,144, issued on Feb. 17, was assigned to KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS (Dhahran, Saudi Arabia). "Method of making supercapa... Read More
ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,556,956, issued on Feb. 17, was assigned to Telefonaktiebolaget LM Ericsson (Publ) (Stockholm). "Beam-based radio resource management measureme... Read More
ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,557,467, issued on Feb. 17, was assigned to Semiconductor Energy Laboratory Co. Ltd. (Japan). "Light-emitting device, light-emitting apparatus,... Read More
ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,716, issued on Feb. 17, was assigned to NextNav LLC (Santa Clara, Calif.). "Systems and methods for determining when an estimated altitude ... Read More
ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,554,681, issued on Feb. 17, was assigned to DIGIWIN Co. LTD. (Shanghai) and DATA SYSTEMS Co. LTD. (New Taipei, Taiwan). "System and method of u... Read More
ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,554,668, issued on Feb. 17, was assigned to Huawei Technologies'Co.'Ltd.' (Shenzhen, China). "Chip management apparatus and related method" was... Read More
ALEXANDRIA, Va., Feb. 17 -- United States Patent no. D1,114,279, issued on Feb. 17, was assigned to 9213-4550 QUEBEC INC. (Drummondville, Canada). "Spa" was invented by Jerome Foy (Orford, Canada). ... Read More
ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,555,681, issued on Feb. 17, was assigned to PULSENMORE LTD (Omer, Israel). "System for acquiring ultrasound images" was invented by Elazar Sonn... Read More
ALEXANDRIA, Va., Feb. 17 -- United States Patent no. D1,113,274, issued on Feb. 17, was assigned to ShenZhen YiHong Technology Co. LTD (ShenZhen, China). "Drawer unit" was invented by Yi Dai (ShenZhe... Read More
ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,945, issued on Feb. 17, was assigned to Testmetrix Inc. (San Jose, Calif.). "Apparatus and method for testing semiconductor devices" was in... Read More