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US Patent Issued to Hitachi on May 26 for "Vehicle speed calculation device and vehicle speed calculation method" (Japanese Inventor)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,468, issued on May 26, was assigned to Hitachi Ltd. (Tokyo). "Vehicle speed calculation device and vehicle speed calculation method" was inv... Read More


US Patent Issued to Allegro MicroSystems on May 26 for "Magnetic field speed sensor output signal protocol" (German Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,469, issued on May 26, was assigned to Allegro MicroSystems LLC (Manchester, N.H.). "Magnetic field speed sensor output signal protocol" was... Read More


US Patent Issued to Arctevity on May 26 for "Digital air flow detection in a duct" (Massachusetts, New Hampshire Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,470, issued on May 26, was assigned to Arctevity Inc. (Woburn, Mass.). "Digital air flow detection in a duct" was invented by Michael Burka ... Read More


US Patent Issued to Robert Bosch, Robert Bosch Engineering and Business Solutions on May 26 for "Device and method to determine a swim metric" (Indian Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,471, issued on May 26, was assigned to Robert Bosch GmbH (Stuttgart, Germany) and Robert Bosch Engineering and Business Solutions Private Ltd... Read More


US Patent Issued to MSSCORPS, National Chung Hsing University on May 26 for "Method for obtaining the equivalent oxide thickness of a dielectric layer" (Taiwanese Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,472, issued on May 26, was assigned to MSSCORPS Co. LTD. (Hsinchu City, Taiwan) and National Chung Hsing University (Taichung City, Taiwan). ... Read More


US Patent Issued to HICON on May 26 for "Socket device for testing ICs" (South Korean Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,473, issued on May 26, was assigned to HICON Co. LTD. (Seongnam-si, South Korea). "Socket device for testing ICs" was invented by Dong Weon ... Read More


US Patent Issued to POINT ENGINEERING on May 26 for "Electrically conductive contact pin" (South Korean Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,474, issued on May 26, was assigned to POINT ENGINEERING Co. LTD. (Chungcheongnam-do, South Korea). "Electrically conductive contact pin" wa... Read More


US Patent Issued to SAMSUNG ELECTRONICS on May 26 for "Eye margin test method and electronic apparatus performing test operation based on the same" (South Korean Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,475, issued on May 26, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea). "Eye margin test method and electronic appar... Read More


US Patent Issued to Huawei Technologies'Co., 'Ltd.' on May 26 for "Voltage sampling apparatus and related method" (Chinese Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,476, issued on May 26, was assigned to Huawei Technologies'Co.'Ltd.' (Shenzhen, China). "Voltage sampling apparatus and related method" was ... Read More


US Patent Issued to ROOTECH on May 26 for "High current measuring device" (South Korean Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,477, issued on May 26, was assigned to ROOTECH INC. (Suwon-si, South Korea). "High current measuring device" was invented by Changyong Jeong... Read More