ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,843, issued on Aug. 25, was assigned to Bruker Optics GmbH & Co. KG (Ettlingen, Germany). "Optoelectronic chip" was invented by Pierre Turs... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,844, issued on Aug. 25, was assigned to InnerPlant Inc. (Davis, Calif.). "Sensor plant and method for identifying stressors in crops based ... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,845, issued on Aug. 25, was assigned to Virginia Tech Intellectual Properties Inc. (Blacksburg, Va.). "Methods of disease detection and cha... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,846, issued on Aug. 25, was assigned to LIGHTNOVO APS (Birkerod, Denmark). "Apparatus for carrying out spectroscopy" was invented by Oleksi... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,847, issued on Aug. 25, was assigned to Pendar Technologies Inc. (Cambridge, Mass.) and The General Hospital Corp. (Boston). "Donor organ v... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,848, issued on Aug. 25, was assigned to KOENIG & BAUER AG (Wurzburg, Germany). "Machine for handling sheets, comprising an inspection devic... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,849, issued on Aug. 25, was assigned to KONICA MINOLTA INC. (Tokyo). "Inspection apparatus, recording medium, and inspection system" was in... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,850, issued on Aug. 25, was assigned to TIAMA (St. Genis-Laval, France). "Optical-computing device and method for analysing light passing t... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,851, issued on Aug. 25, was assigned to Ushio Denki K.K. (Tokyo). "Tablet spectroscopic measurement method" was invented by Aya Ota (Tokyo)... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,852, issued on Aug. 25, was assigned to Tata Consultancy Services Ltd. (Mumbai, India). "Non-contact method and system for inspection and d... Read More