Publication

Byline

Location

US Patent Issued to Rohde & Schwarz on July 21 for "Measurement instrument and system for enhanced constellation diagrams and method thereof" (British Inventor)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,573, issued on July 21, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich). "Measurement instrument and system for enhanced constellati... और पढ़ें


US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on July 21 for "Semiconductor testing apparatus and method for testing semiconductor structure" (Taiwanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,574, issued on July 21, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Semiconductor testing apparatus... और पढ़ें


US Patent Issued to Infineon Technologies on July 21 for "Controlled switching of stress voltages in lateral DMOS structures" (German, Austrian Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,575, issued on July 21, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Controlled switching of stress voltages in lateral ... और पढ़ें


US Patent Issued to MATERIALS ANALYSIS TECHNOLOGY on July 21 for "Testing device and testing system" (Taiwanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,576, issued on July 21, was assigned to MATERIALS ANALYSIS TECHNOLOGY INC. (Zhubei City, Taiwan). "Testing device and testing system" was i... और पढ़ें


US Patent Issued to SAMSUNG ELECTRONICS on July 21 for "Method, device, and system for detecting fuse configuration for trimming circuit" (South Korean Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,577, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Method, device, and system for detecting fus... और पढ़ें


US Patent Issued to Taiwan Semiconductor Manufacturing on July 21 for "Wrapper cell design and built-in self-test architecture for 3DIC test and diagnosis" (American, Taiwanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,578, issued on July 21, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Wrapper cell design and built-in se... और पढ़ें


US Patent Issued to ABB Schweiz on July 21 for "Method and system for detecting stator inter-turn fault in induction machines" (Indian Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,579, issued on July 21, was assigned to ABB Schweiz AG (Baden, Switzerland). "Method and system for detecting stator inter-turn fault in in... और पढ़ें


US Patent Issued to SK On on July 21 for "Secondary battery cell insulation test apparatus and method using the same" (South Korean Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,580, issued on July 21, was assigned to SK On Co. Ltd. (Seoul, South Korea). "Secondary battery cell insulation test apparatus and method u... और पढ़ें


US Patent Issued to Analog Devices on July 21 for "Technique for estimation of internal battery temperature" (Massachusetts Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,581, issued on July 21, was assigned to Analog Devices Inc. (Wilmington, Mass.). "Technique for estimation of internal battery temperature"... और पढ़ें


US Patent Issued to GS YUASA INTERNATIONAL on July 21 for "Correction method for estimated state-of-charge value of energy storage device, management apparatus for energy storage device, and energy storage apparatus" (Japanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,582, issued on July 21, was assigned to GS YUASA INTERNATIONAL LTD. (Kyoto, Japan). "Correction method for estimated state-of-charge value ... और पढ़ें