ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,562, issued on July 21, was assigned to Piezo Ultratech Co. LTD. (Tainan City, Taiwan). "Shear mode piezoelectric accelerometer" was invent... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,563, issued on July 21, was assigned to Tektronix Inc. (Beaverton, Ore.). "Separating noise to increase machine learning prediction accurac... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,564, issued on July 21, was assigned to Apple Inc. (Cupertino, Calif.). "Capacitance measurement circuitry for a resonant tank" was invente... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,565, issued on July 21, was assigned to Alphacore Inc. (Tempe, Ariz.). "Systems and methods for signal sampling using a sampling array" was... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,566, issued on July 21, was assigned to Honeywell International Inc. (Charlotte, N.C.). "Detector and method for non-intrusively detecting ... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,567, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Electric field measuring apparatus and metho... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,568, issued on July 21, was assigned to ARTI ANALYTICS INC. (Morgan Hill, Calif.). "Method and process of fault detection in power systems ... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,569, issued on July 21, was assigned to SK On Co. Ltd. (Seoul, South Korea). "Secondary battery cell insulation test apparatus for simultan... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,570, issued on July 21, was assigned to LS ELECTRIC Co. LTD. (Anyang-si, South Korea). "Insulation monitoring device and method for control... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,572, issued on July 21, was assigned to FUJI ELECTRIC Co. LTD. (Kanagawa, Japan). "Test method" was invented by Kenichi Ishii (Matsumoto-ci... और पढ़ें