ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,507, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Storage device and operating method thereof"... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,508, issued on July 21, was assigned to Dell Products LP (Round Rock, Texas). "Workspace orchestration with ephemeral hardware attestation"... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,509, issued on July 21, was assigned to Rockwell Automation Technologies Inc. (Mayfield Heights, Ohio). "Industrial automation system with ... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,510, issued on July 21, was assigned to NTT Research Inc. (Sunnyvale, Calif.). "Fast attribute-based encryption with improved security" was... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,646, issued on July 21, was assigned to KONICA MINOLTA INC. (Tokyo). "Radiation detection device comprising a radiation detector, an electr... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,648, issued on July 21, was assigned to Canon K.K. (Tokyo). "Radiography apparatus, radiography system, and control method of radiography a... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,650, issued on July 21, was assigned to ExxonMobil Technology and Engineering Co. (Spring, Texas). "Methods of generating a parameter reali... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,630, issued on July 21, was assigned to FUJIFILM Business Innovation Corp. (Tokyo). "Detection device, image forming apparatus, non-transit... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,631, issued on July 21, was assigned to Ningbo ABAX Sensing Electronic Technology Co. Ltd. (Ningbo City, China). "Signal extraction circuit... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,632, issued on July 21, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan). "Optical measurement device and optical measurement me... Read More