ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,142, issued on April 7, was assigned to DeepSig Inc. (Arlington, Va.). "Systems and methods for detecting and classifying drone signals" wa... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,143, issued on April 7, was assigned to Advantest Corp. (Tokyo). "Over the air (OTA) testing of an antenna in package (AiP) device in radia... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,144, issued on April 7, was assigned to SHANGHAI UNIVERSITY OF ELECTRIC POWER (Shanghai), STATE GRID SHANGHAI MUNICIPAL ELECTRIC POWER COMPA... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,145, issued on April 7, was assigned to Tektronix Inc. (Beaverton, Ore.). "Optical tuning test system using parallel oven pipelines with pa... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,146, issued on April 7, was assigned to YOKOWO Co. LTD. (Tokyo). "Socket, jig, socket maintenance set, and disassembly method" was invented... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,147, issued on April 7, was assigned to JAPAN ELECTRONIC MATERIALS Corp. (Hyogo, Japan). "Alignment chip for probe card, probe card and pro... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,148, issued on April 7, was assigned to NVIDIA Corp. (Santa Clara, Calif.). "Jitter injection generator for measuring phase noise and jitte... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,149, issued on April 7, was assigned to Siemens Industry Software Inc. (Plano, Texas). "Diagnosing identical circuit blocks in data streami... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,150, issued on April 7, was assigned to Siemens Industry Software Inc. (Plano, Texas). "X-masking for in-system deterministic test" was inv... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,151, issued on April 7, was assigned to China Special Equipment Inspection and Research Institute (Beijing). "System and method for testing... Read More