ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,078, issued on April 7, was assigned to SK SILTRON Co. LTD. (Gumi-si, South Korea). "Apparatus for analyzing metal contamination of a wafer... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,079, issued on April 7, was assigned to TANK-EYE IE B.V. (Hendrik-Ido-Ambacht, Netherlands). "Assembly for sensory and visual inspection of... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,080, issued on April 7, was assigned to GM GLOBAL TECHNOLOGY OPERATIONS LLC (Detroit). "Vision inspection systems and methods using light s... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,081, issued on April 7, was assigned to ARIZONA BOARD OF REGENTS ON BEHALFOF ARIZONA STATE UNIVERSITY (Scottsdale, Ariz.) and California Ins... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,082, issued on April 7, was assigned to BRUKER NANO GMBH (Berlin). "Proximity sensor for electron backscatter diffraction systems" was inve... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,083, issued on April 7, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Automated analyzer" was invented by Kohji Okada (Kyoto, Japan). Ac... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,084, issued on April 7, was assigned to Decision Tree LLC (Greeley, Colo.) and Veracio Ltd (Salt Lake City). "Machine learning for high-ene... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,085, issued on April 7. "Method and apparatus for simultaneously measuring air contained hydrogen and water vapor concentrations via a sing... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,086, issued on April 7, was assigned to Mettler-Toledo GmbH (Greifensee, Switzerland). "Sensor assembly for a differential scanning calorim... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,087, issued on April 7, was assigned to ISENSPRO NV (Leuven, Belgium). "System and method for measuring condensation and/or advance of corr... और पढ़ें