GENEVA, June 19 -- VODA CO., LTD. filed a patent application (KR2025/018586) for “INTELLIGENT ALGORITHM-BASED REAL-TIME ANOMALY DETECTION IMAGE AND DATA PROCESSING SYSTEM”. With publication no. WO/202... Read More
GENEVA, June 19 -- CHO, Ji Young filed a patent application (KR2025/018566) for “FIRE DAMAGE REDUCTION SYSTEM FOR ELECTRIC VEHICLE WITH SEPARABLE BATTERY”. With publication no. WO/2026/106287, here ar... Read More
GENEVA, June 19 -- SEOUL VIOSYS CO., LTD. filed a patent application (KR2025/018569) for “NITRIDE-BASED SEMICONDUCTOR DEVICE”. With publication no. WO/2026/106288, here are the other details related t... Read More
GENEVA, June 19 -- GRAPHY INC. filed a patent application (KR2025/018571) for “NOVEL DENTAL PROSTHETIC MATERIAL AND PATIENT-CUSTOMIZED DENTAL PROSTHESIS COMPRISING SAME”. With publication no. WO/2026/... Read More
GENEVA, June 19 -- SAMSUNG ELECTRONICS CO., LTD. filed a patent application (KR2025/018531) for “APPARATUS AND METHOD FOR CARRYING OUT DIGITAL PRE-DISTORTION BASED ON CONDITIONAL GENERATIVE ADVERSARIA... Read More
GENEVA, June 19 -- SAMSUNG ELECTRONICS CO., LTD. filed a patent application (KR2025/018536) for “METHOD AND APPARATUS FOR ALLOCATING RESOURCES OF PHYSICAL UPLINK CONTROL CHANNEL IN WIRELESS COMMUNICAT... Read More
GENEVA, June 19 -- LG INNOTEK CO., LTD. filed a patent application (KR2025/018550) for “MEMS MICROPHONE”. With publication no. WO/2026/106284, here are the other details related to the patent applicat... Read More
GENEVA, June 19 -- SAMSUNG SDI CO., LTD. filed a patent application (KR2025/018518) for “SEPARATOR FOR SECONDARY BATTERY AND SECONDARY BATTERY COMPRISING SAME”. With publication no. WO/2026/106279, he... Read More
GENEVA, June 19 -- SAMSUNG ELECTRONICS CO., LTD. filed a patent application (KR2025/018519) for “METHOD, ELECTRONIC DEVICE, PROGRAM, AND STORAGE MEDIUM FOR DETERMINING, BY USING OBJECT, ACTIVITY TO BE... Read More
GENEVA, June 19 -- IUCF-HYU(INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) filed a patent application (KR2025/018530) for “APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR SUBSTRATE U... Read More