ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,572, issued on July 21, was assigned to Genentech Inc. (South San Francisco, Calif.). "Using deep learning to process images of the eye to ... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,573, issued on July 21, was assigned to SEMES Co. LTD. (Chungcheongnam-do, South Korea). "Substrate inspecting unit and substrate treating ... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,574, issued on July 21, was assigned to KLA Corp. (Milpitas, Calif.). "Multimode defect detection" was invented by Sangbong Park (Union Cit... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,575, issued on July 21, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong). "Method and device for detecting imag... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,576, issued on July 21, was assigned to UVeye Ltd. (Tel Aviv, Israel). "Vehicle inspection system and method with adaptive template matchin... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,578, issued on July 21, was assigned to Paige.AI Inc. (New York). "Systems and methods to process electronic images to categorize intra-sli... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,579, issued on July 21, was assigned to Globus Medical Inc. (Audubon, Pa.). "Registration of 3D and 2D images for surgical navigation and r... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,580, issued on July 21, was assigned to Sheba Impact Ltd. (Ramat Gan, Israel) and Sami Shamoon College of Engineering (R.A) (Beer-Sheva, Isr... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,581, issued on July 21, was assigned to LUNIT INC. (Seoul, South Korea). "Method and apparatus for providing information associated with im... और पढ़ें
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,582, issued on July 21, was assigned to Aidoc Medical Ltd (Tel Aviv, Israel). "Series selection for computer vision machine learning models... और पढ़ें