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US Patent Issued to WEST VIRGINIA UNIVERSITY on April 14 for "Diagnosing mild cognitive impairment (MCI), predicting alzheimer's disease (AD) dementia onset, and screening and monitoring agents for treating mci or preventing dementia onset" (Maryland, West Virginia Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,750, issued on April 14, was assigned to WEST VIRGINIA UNIVERSITY (Morgantown, W.va.). "Diagnosing mild cognitive impairment (MCI), predic... Read More


US Patent Issued to Shanghai Zhongqi Biotechnology on April 14 for "Protein antigen combination for detection of Alzheimer's disease and application thereof" (Chinese Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,751, issued on April 14, was assigned to Shanghai Zhongqi Biotechnology Co. Ltd. (Shanghai). "Protein antigen combination for detection of... Read More


US Patent Issued to FEI on April 14 for "Smart sample container for complex sample evaluation workflows" (Dutch, Norwegian Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,752, issued on April 14, was assigned to FEI Co. (Hillsboro, Ore.). "Smart sample container for complex sample evaluation workflows" was i... Read More


US Patent Issued to HITACHI HIGH-TECH on April 14 for "Automatic analyzer and assembly support system thereof" (Japanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,753, issued on April 14, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Automatic analyzer and assembly support system thereof" was inv... Read More


US Patent Issued to SEIKO EPSON on April 14 for "MEMS device and inertial measurement unit" (Japanese Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,754, issued on April 14, was assigned to SEIKO EPSON Corp. (Japan). "MEMS device and inertial measurement unit" was invented by Satoru Tan... Read More


US Patent Issued to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT on April 14 for "Characteristic calculation device, characteristic calculation method, and non-transitory computer-readable recording medium" (Japanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,755, issued on April 14, was assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT Co. LTD. (Osaka, Japan). "Characteristic calculation d... Read More


US Patent Issued to UNITED MICROELECTRONICS on April 14 for "Matching method for semiconductor topography measurement and processing device using the same" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,756, issued on April 14, was assigned to UNITED MICROELECTRONICS CORP. (Hsinchu, Taiwan). "Matching method for semiconductor topography me... Read More


US Patent Issued to DONG-A UNIVERSITY RESEARCH FOUNDATION FOR INDUSTRY-ACADEMY COOPERATION on April 14 for "Ultra-micro electrode for electrochemical analysis and method of manufacturing the same" (South Korean Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,757, issued on April 14, was assigned to DONG-A UNIVERSITY RESEARCH FOUNDATION FOR INDUSTRY-ACADEMY COOPERATION (Busan, South Korea). "Ult... Read More


US Patent Issued on April 14 for "Socketed probes" (Texas Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,758, issued on April 14. "Socketed probes" was invented by Raul Molina (Austin, Texas). According to the abstract* released by the U.S. P... Read More


US Patent Issued to CHUNGHWA PRECISION TEST TECH. on April 14 for "Cantilever probe card device and light scattering probe" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,759, issued on April 14, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan). "Cantilever probe card device and ... Read More