ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,141, issued on Aug. 25, was assigned to Toyota Research Institute Inc. (Los Altos, Calif.). "Systems and methods for predicting the effect ... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,142, issued on Aug. 25, was assigned to Hewlett Packard Enterprise Development LP (Spring, Texas). "Automatic data quality monitoring using... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,143, issued on Aug. 25, was assigned to Microsoft Technology Licensing LLC (Redmond, Wash.). "Training and implementing a data quality veri... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,144, issued on Aug. 25, was assigned to Aktiebolaget SKF (Gothenburg, Sweden). "System and method for validating unsupervised machine learn... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,145, issued on Aug. 25, was assigned to National Astronomical Observatories, Chinese Academy of Sciences (Beijing). "Method for correcting ... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,146, issued on Aug. 25, was assigned to Capital One Services LLC (McLean, Va.). "Generating counterfactual samples based on user preference... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,147, issued on Aug. 25, was assigned to NEC Corp. (Tokyo). "Rule generation apparatus, rule generation method, and non-transitory computer ... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,148, issued on Aug. 25, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Identification of hierarchical reconciliatio... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,149, issued on Aug. 25, was assigned to SONY GROUP Corp. (Tokyo). "Learning data generating device, learning data generating method, learni... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,150, issued on Aug. 25, was assigned to HITACHI SOLUTIONS LTD. (Tokyo). "AI quality monitoring system" was invented by Hidekazu Ito (Tokyo)... Read More