ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,099, issued on Oct. 6, was assigned to Meta Platforms Technologies LLC (Menlo Park, Calif.). "Optical combiners for binocular disparity dete... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,100, issued on Oct. 6, was assigned to Fujikura Ltd. (Tokyo). "Crosstalk measuring method, and crosstalk measuring device" was invented by K... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,101, issued on Oct. 6, was assigned to ODYSIGHT.AI LTD. (Omer, Israel). "System and method for monitoring moving elements" was invented by A... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,102, issued on Oct. 6, was assigned to Resonance Systems Inc. (Knoxville, Tenn.). "Valve event monitoring sensor" was invented by Richard Pa... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,103, issued on Oct. 6, was assigned to Volkswagen AG (Wolfsburg, Germany). "System and method for diagnosing a crankcase ventilation system ... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,104, issued on Oct. 6, was assigned to Lyten Inc. (San Jose, Calif.). "Field deployable resonant sensors" was invented by Michael Stowell (S... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,105, issued on Oct. 6, was assigned to Huttlin GmbH (Schopfheim, Germany). "Method and apparatus for recognizing a fault state of a machine ... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,106, issued on Oct. 6, was assigned to LEICA MIKROSYSTEME GMBH (Vienna). "Method for producing a section ribbon from a sample block using a ... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,107, issued on Oct. 6, was assigned to LockCon AG (Wil, Switzerland). "Sample taking device, sample taking system and method of operating a ... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,108, issued on Oct. 6, was assigned to FEI Co. (Hillsboro, Ore.). "Systems and methods for accurate layer detection and analysis in charged ... Read More