ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,506, issued on April 21, was assigned to Seiko Epson Corp. (Tokyo). "Color measuring system, backing plate, and color measuring apparatus"... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,507, issued on April 21, was assigned to Purdue Research Foundation (West Lafayette, Ind.). "Autonomous phenotype imaging system" was inve... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,508, issued on April 21, was assigned to MURATA MANUFACTURING Co. LTD. (Nagaokakyo, Japan). "Piezoelectric interferometer" was invented by... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,509, issued on April 21, was assigned to MURATA MANUFACTURING Co. LTD. (Nagaokakyo, Japan). "Interferometer with absorbing layer" was inve... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,510, issued on April 21, was assigned to ANRITSU Corp. (Kanagawa, Japan). "Optical spectrum analyzer" was invented by Maki Ueno (Kanagawa,... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,511, issued on April 21, was assigned to TSINGHUA UNIVERSITY (Beijing) and BEIJING SEETRUM TECHNOLOGY Co. LTD. (Beijing). "Reconstruction ... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,512, issued on April 21, was assigned to THE UNIVERSITY OF TOKYO (Tokyo). "Electronic state splitter for atoms, atom interferometer atomic... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,513, issued on April 21, was assigned to PPG Industries Ohio Inc. (Cleveland). "Light-based protractor and use thereof for detection of co... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,514, issued on April 21, was assigned to Uster Technologies AG (Uster, Switzerland). "Optically characterizing a textile fiber structure" ... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,515, issued on April 21, was assigned to ZHEJIANG PIXFRA TECHNOLOGY Co. LTD. (Hangzhou, China). "Systems and methods for temperature deter... Read More