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INTERNATIONAL PATENT: JFE STEEL CORPORATION, JFEスチール株式会社 FILES APPLICATION FOR "METHOD FOR OPERATING REDUCTION FURNACE AND METHOD FOR PRODUCING REDUCED IRON"

GENEVA, Dec. 22 -- JFE STEEL CORPORATION (2-3, Uchisaiwai-cho 2-chome, Chiyoda-ku, Tokyo1000011), JFEスチール株式会社 (東&#20... Read More


INTERNATIONAL PATENT: FUJIFILM CORPORATION, 富士フイルム株式会社 FILES APPLICATION FOR "VARIABLE MAGNIFICATION OPTICAL SYSTEM AND IMAGING DEVICE"

GENEVA, Dec. 22 -- FUJIFILM CORPORATION (26-30, Nishiazabu 2-chome, Minato-ku, Tokyo1068620), 富士フイルム株式会社 (東京都... Read More


INTERNATIONAL PATENT: DENSO CORPORATION, 株式会社デンソー FILES APPLICATION FOR "CONTROL DEVICE FOR ROTARY ELECTRIC MACHINE, PROGRAM AND CONTROL METHOD FOR ROTARY ELECTRIC MACHINE"

GENEVA, Dec. 22 -- DENSO CORPORATION (1-1, Showa-cho, Kariya-city, Aichi4488661), 株式会社デンソー (愛知県刈谷市&#26... Read More


INTERNATIONAL PATENT: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD., パナソニックIPマネジメント株式会社 FILES APPLICATION FOR "GLASS PANEL UNIT"

GENEVA, Dec. 22 -- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD. (22-6, Moto-machi, Kadoma-shi, Osaka5710057), パナソニックIPマネ&#... Read More


INTERNATIONAL PATENT: NUVOTON TECHNOLOGY CORPORATION JAPAN, ヌヴォトンテクノロジージャパン株式会社 FILES APPLICATION FOR "SEMICONDUCTOR LASER ELEMENT"

GENEVA, Dec. 22 -- NUVOTON TECHNOLOGY CORPORATION JAPAN (1 Kotari-yakemachi, Nagaokakyo City, Kyoto6178520), ヌヴォトンテクノロジー&#1... Read More


INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "AUTOMATIC ANALYSIS DEVICE AND NOISE DETECTION METHOD FOR AUTOMATIC ANALYSIS DEVICE"

GENEVA, Dec. 22 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京&... Read More


INTERNATIONAL PATENT: KABUSHIKI KAISHA KOBE SEIKO SHO (KOBE STEEL, LTD.), 株式会社神戸製鋼所 FILES APPLICATION FOR "TRANSPORT MECHANISM"

GENEVA, Dec. 22 -- KABUSHIKI KAISHA KOBE SEIKO SHO (KOBE STEEL, LTD.) (2-4, Wakinohama-Kaigandori 2-chome, Chuo-ku, Kobe-shi, Hyogo6518585), 株式会社神戸製&#3... Read More


INTERNATIONAL PATENT: SUMCO CORPORATION, 株式会社SUMCO FILES APPLICATION FOR "WAFER APPEARANCE INSPECTION DEVICE AND WAFER APPEARANCE INSPECTION METHOD"

GENEVA, Dec. 22 -- SUMCO CORPORATION (2-1, Shibaura 1-chome, Minato-ku, Tokyo1058634), 株式会社SUMCO (東京都港&#21306... Read More


INTERNATIONAL PATENT: MITSUBISHI ELECTRIC CORPORATION, 三菱電機株式会社 FILES APPLICATION FOR "WORK MONITORING ASSISTANCE DEVICE, WORK MONITORING ASSISTANCE SYSTEM, WORK MONITORING ASSISTANCE METHOD AND PROGRAM"

GENEVA, Dec. 22 -- MITSUBISHI ELECTRIC CORPORATION (7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo1008310), 三菱電機株式会社 (東京都&#2131... Read More


INTERNATIONAL PATENT: MITSUBISHI ELECTRIC CORPORATION, 三菱電機株式会社 FILES APPLICATION FOR "COMMUNICATION DEVICE, COMMUNICATION METHOD AND PROGRAM"

GENEVA, Dec. 22 -- MITSUBISHI ELECTRIC CORPORATION (7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo1008310), 三菱電機株式会社 (東京都&#2131... Read More