GENEVA, March 2 -- TDK ELECTRONICS AG (Rosenheimer Str. 141 e81671 Munchen) filed a patent application (PCT/EP2025/070651) for "RING-TAB SENSOR AND FASTENING ELEMENT" on Jul 18, 2025. With publication... Read More
GENEVA, March 2 -- SIEMENS AKTIENGESELLSCHAFT (Werner-von-Siemens-StraBe 180333 Munchen) filed a patent application (PCT/EP2025/067847) for "CHANNEL SYNCHRONIZATION IN MULTI-SPINDLE MACHINE TOOLS" on ... Read More
GENEVA, March 2 -- BASELL POLYOLEFINE GMBH (Bruehler Strasse 6050389 Wesseling) filed a patent application (PCT/EP2025/071146) for "POLYMER BLEND FOR THE PRODUCTION OF A MONO-AXIALLY ORIENTED FILM" on... Read More
GENEVA, March 2 -- FRAUNHOFER-GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG E. V. (Hansastr. 27c80686 Munchen), RHEINISCH WESTFALISCHE TECHNISCHE HOCHSCHULE AACHEN, ABGEKURZT RWTH AACHEN, KORPE... Read More
GENEVA, March 2 -- INVENTIO AG (Seestrasse 556052 Hergiswil) filed a patent application (PCT/EP2025/070080) for "ELEVATOR MOTOR WITH IMPROVED BEARING LUBRICATION" on Jul 14, 2025. With publication no.... Read More
GENEVA, March 2 -- CONSEJO SUPERIOR DE INVESTIGACIONES CIENTIFICAS (CSIC) (Serrano, 11728006 Madrid) filed a patent application (PCT/EP2025/063676) for "MICROREACTOR AND COATING METHOD" on May 19, 202... Read More
GENEVA, March 2 -- SEW-EURODRIVE GMBH & CO KG (Ernst-Blickle-StraBe 4276646 Bruchsal) filed a patent application (PCT/EP2025/070100) for "TRANSPORT SYSTEM HAVING A MOBILE PART MOVABLE ALONG A ROUTE, I... Read More
GENEVA, March 2 -- PHOENIX CONTACT GMBH & CO. KG (FlachsmarktstraBe 832825 Blomberg) filed a patent application (PCT/EP2025/070594) for "ELECTRICAL CONTACT ELEMENT" on Jul 18, 2025. With publication n... Read More
GENEVA, March 2 -- KB INTELLECTUAL PROPERTY GMBH & CO. KG (Zugspitzstr. 382049 Pullach) filed a patent application (PCT/EP2025/071422) for "DRUM BRAKE, IN PARTICULAR FOR A UTILITY VEHICLE" on Jul 25, ... Read More
GENEVA, March 2 -- ASML NETHERLANDS B.V. (P.O. Box 3245500 AH Veldhoven) filed a patent application (PCT/EP2025/070620) for "A METHOD FOR MODELING METROLOGY DATA OVER A SUBSTRATE AREA AND ASSOCIATED A... Read More