ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,537,593, issued on Jan. 27. "ThinSat constellations that are a group of satellites for carrying payloads for experimentation and data collectio... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,545, issued on Jan. 27, was assigned to Target Brands Inc. (Minneapolis). "Generating security event case files from disparate unstructured... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,499, issued on Jan. 27, was assigned to COLOSSEUM Corp. INC. (Seoul, South Korea). "Logistics automation system and operating method thereo... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,533,088, issued on Jan. 27, was assigned to AT&T Intellectual Property I LP (Atlanta). "System and method for performing a diagnostic analysis ... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,332, issued on Jan. 27, was assigned to Nanning FuLian FuGui Precision Industrial Co. Ltd. (Nanning, China). "Method, device and non-transi... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,116, issued on Jan. 27, was assigned to SK hynix Inc. (Icheon-si, South Korea). "SSD having dual port mode wherein ports operate independen... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,534,759, issued on Jan. 27, was assigned to The Johns Hopkins University (Baltimore). "Safe sequencing system" was invented by Bert Vogelstein ... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,533,635, issued on Jan. 27, was assigned to MITSUBISHI HEAVY INDUSTRIES LTD. (Tokyo). "Electrodialysis device" was invented by Kaoru Egawa (Tok... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. D1,110,103, issued on Jan. 27. "Silicone flower shaped round cake pan" was invented by Xiuyan Liang (Yangjiang, China). The patent was filed on M... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,438, issued on Jan. 27, was assigned to Bruker Technologies Ltd. (Migdal HaEmek, Israel). "Analysis of x-ray scatterometry data using deep ... Read More