ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,566, issued on May 19, was assigned to FUJIFILM Corp. (Tokyo). "Inspection support device, inspection support method, and program" was inven... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,567, issued on May 19, was assigned to Tyco Electronics (Shanghai) Co. Ltd. (Shanghai), TE Connectivity Solutions GmbH (Schaffhausen, Switzer... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,568, issued on May 19, was assigned to Instrumentation Laboratory Co. (Bedford, Mass.). "Cartridges and uses thereof" was invented by Hanson... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,569, issued on May 19, was assigned to NANJING UNIVERSITY OF FINANCE & ECONOMICS (Nanjing, China). "Method, device, system and computer read... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,570, issued on May 19, was assigned to United Arab Emirates University (Al Ain, United Arab Emirates) and University of Khorfakkan (Sharjah, ... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,571, issued on May 19, was assigned to Baker Hughes Holdings LLC (Houston). "Apparatus for fully automated X-ray tomography system performan... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,572, issued on May 19, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea) and SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION (Se... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,573, issued on May 19, was assigned to HITACHI HIGH-TECH ANALYSIS Corp. (Tokyo). "X-ray inspection apparatus and method of inspection with X... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,574, issued on May 19, was assigned to HITACHI HIGH-TECH ANALYSIS Corp. (Tokyo). "X-ray transmission inspection apparatus and X-ray transmis... Read More
ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,575, issued on May 19, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY Co. Ltd. (Ningde City, China). "Battery defect inspection device, met... Read More