ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,460, issued on Aug. 18, was assigned to KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE (Daejeon, South Korea). "Electromagnetically indu... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,461, issued on Aug. 18, was assigned to Digital Global Systems Inc. (Tysons Corner, Va.). "Systems, methods, and devices for automatic sign... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,462, issued on Aug. 18, was assigned to OTOWA ELECTRIC Co. LTD. (Osaka, Japan). "Sensor device capable of measuring electric field strength... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,463, issued on Aug. 18, was assigned to Teradyne Inc. (North Reading, Mass.). "Analyzing bundles of wires" was invented by Tushar Gohel (Wi... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,464, issued on Aug. 18, was assigned to DAC System SA (Manno, Switzerland). "Fault detection method" was invented by Paolo Delmastro (Laina... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,465, issued on Aug. 18, was assigned to LS CABLE & SYSTEM LTD. (Anyang-si, South Korea). "Partial discharge monitoring system and partial d... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,466, issued on Aug. 18, was assigned to Arizona Board of Regents on Behalf of Arizona State University (Tempe, Ariz.). "Systems and methods... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,467, issued on Aug. 18, was assigned to NANYA TECHNOLOGY Corp. (New Taipei City, Taiwan). "Wafer tester and wafer testing method and system... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,468, issued on Aug. 18, was assigned to MICROTEST S.P.A. (Vicopisano, Italy). "Method and system of developing and executing test program f... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,469, issued on Aug. 18, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich). "Modular positioner and/or fixture, measurement system and ... Read More