ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,707, issued on Sept. 22, was assigned to Politecnico Di Tornio (Turin, Italy), Universita Degli Studi Firenze (Florence, Italy), Azienda Os... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,708, issued on Sept. 22, was assigned to Sintokogio Ltd. (Nagoya, Japan). "Gas detection system" was invented by Manase Mizutani (Nagoya, ... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,709, issued on Sept. 22, was assigned to Japan Aerospace Exploration Agency (Japan). "Ionized material sample collection device and collec... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,710, issued on Sept. 22, was assigned to ROLLS-ROYCE plc (London). "System and method for scanning a component" was invented by Akhil Mull... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,711, issued on Sept. 22, was assigned to The Boeing Co. (Arlington, Va.). "Systems and methods for material testing and material testpiece... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,713, issued on Sept. 22, was assigned to Southwest Petroleum University (Chengdu, China). "Method for evaluating rock compressive strength... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,714, issued on Sept. 22, was assigned to IHC Holland I.E. B.V. (Sliedrecht, Netherlands). "System for measuring of a concentration paramet... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,715, issued on Sept. 22, was assigned to Honeywell International Inc. (Charlotte, N.C.). "Improving accuracy by adding additional sensors ... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,716, issued on Sept. 22, was assigned to UNIVERSITY OF HONG KONG VERSITECH Ltd. (Pokfulam, Hong Kong) and Southern University of Science an... और पढ़ें
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,717, issued on Sept. 22, was assigned to TRIPLE WIN TECHNOLOGY(SHENZHEN) Co. LTD. (Shenzhen, China). "Particle detection method, electroni... और पढ़ें