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US Patent Issued to MITSUBISHI HEAVY INDUSTRIES on Oct. 20 for "Electric circuit system, electric circuit system control device, electric circuit system control method, and electric circuit system control program" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,905, issued on Oct. 20, was assigned to MITSUBISHI HEAVY INDUSTRIES LTD. (Tokyo). "Electric circuit system, electric circuit system control... Read More


US Patent Issued to DENSO on Oct. 20 for "Deterioration determination device, and power conversion device" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,906, issued on Oct. 20, was assigned to DENSO Corp. (Kariya, Japan). "Deterioration determination device, and power conversion device" was ... Read More


US Patent Issued to JEF TECHNO SOLUTIONS PVT on Oct. 20 for "System and method for detecting a faulty connection in an earth grid or an equipment" (Indian Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,907, issued on Oct. 20, was assigned to JEF TECHNO SOLUTIONS PVT LTD (Bangalore, India). "System and method for detecting a faulty connecti... Read More


US Patent Issued to ENDOMAGNETICS on Oct. 20 for "Susceptibility probes for detecting surgical markers" (British Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,908, issued on Oct. 20, was assigned to ENDOMAGNETICS LTD (Great Britain). "Susceptibility probes for detecting surgical markers" was inven... Read More


US Patent Issued to NearField Atomics on Oct. 20 for "Systems and methods for measuring magnetic fields and identifying patterns in the measurements" (Washington Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,909, issued on Oct. 20, was assigned to NearField Atomics Inc. (Seattle). "Systems and methods for measuring magnetic fields and identifyin... Read More


US Patent Issued to TDK on Oct. 20 for "Measurement device" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,910, issued on Oct. 20, was assigned to TDK Corp. (Tokyo). "Measurement device" was invented by Yu Hotta (Tokyo) and Kensuke Sekihara (Hach... Read More


US Patent Issued to TDK on Oct. 20 for "Magnetic sensor device" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,911, issued on Oct. 20, was assigned to TDK Corp. (Tokyo). "Magnetic sensor device" was invented by Kazuya Watanabe (Tokyo), Hiraku Hirabay... Read More


US Patent Issued to Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO on Oct. 20 for "Metrology device and method" (Dutch Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,912, issued on Oct. 20, was assigned to Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO ('s-Gravenhage, Netherla... Read More


US Patent Issued to BlackBerry on Oct. 20 for "Reusable magnetic sensor circuit and methods therefor" (Canadian Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,913, issued on Oct. 20, was assigned to BlackBerry Ltd. (Waterloo, Canada). "Reusable magnetic sensor circuit and methods therefor" was inv... Read More


US Patent Issued to TEXAS INSTRUMENTS on Oct. 20 for "Hall sensor with complementary coil system" (Texas, Arizona Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,914, issued on Oct. 20, was assigned to TEXAS INSTRUMENTS Inc. (Dallas). "Hall sensor with complementary coil system" was invented by Fanpi... Read More