ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,506,031, issued on Dec. 23, was assigned to CHANGXIN MEMORY TECHNOLOGIES INC. (Hefei, China). "Semiconductor structure and method for manufactu... Read More
ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,506,112, issued on Dec. 23, was assigned to Tokyo Electron Ltd. (Tokyo). "Method for etching of metal" was invented by Sergey Voronin (Albany, ... Read More
ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,507,163, issued on Dec. 23, was assigned to THALES DIS FRANCE SAS (Meudon, France). "Method to automatically switch a subscription between tele... Read More
ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,505,647, issued on Dec. 23, was assigned to Viacom International Inc. (New York). "System and method for efficiently checking media content for... Read More
ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,502,339, issued on Dec. 23, was assigned to The Procter & Gamble Co. (Cincinnati). "Foam compositions" was invented by David Frederick Swaile (... Read More
ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,503,077, issued on Dec. 23, was assigned to SUBARU Corp. (Tokyo). "Vehicle electric power management system" was invented by Daeho Jeon (Tokyo)... Read More
ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,507,367, issued on Dec. 23, was assigned to FUJI ELECTRIC Co. LTD. (Kawasaki, Japan). "Power converter" was invented by Toshiaki Azuma (Amagasa... Read More
ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,503,909, issued on Dec. 23, was assigned to UNICEL ARCHITECTURAL CORP. (Longueuil, Canada). "Magnetic louver blind structure in a double-glazed... Read More
ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,278, issued on Dec. 23, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo). "Shape measuring device" was invented by Yuya Arai (Tokyo), Hiro... Read More
ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,404, issued on Dec. 23, was assigned to China Special Equipment Inspection and Research Institute (Beijing). "Apparatus and method for test... Read More