GENEVA, June 26 -- RAPIDUS CORPORATION filed a patent application (JP2024/043310) for “SEMICONDUCTOR CHIPLET, PACKAGE COMPONENT FABRICATION METHOD AND SEMICONDUCTOR CHIPLET FABRICATION METHOD”. With p... Read More
GENEVA, June 26 -- FANUC CORPORATION filed a patent application (JP2024/043289) for “ROBOT CONTROL DEVICE AND ROBOT SYSTEM”. With publication no. WO/2026/120808, here are the other details related to ... Read More
GENEVA, June 26 -- FANUC CORPORATION filed a patent application (JP2024/043301) for “INSPECTION DEVICE AND COMPUTER-READABLE RECORDING MEDIUM”. With publication no. WO/2026/120812, here are the other ... Read More
GENEVA, June 26 -- FANUC CORPORATION filed a patent application (JP2024/043302) for “CONTROL SYSTEM”. With publication no. WO/2026/120813, here are the other details related to the patent application:... Read More
GENEVA, June 26 -- RAPIDUS CORPORATION filed a patent application (JP2024/043286) for “THREE-DIMENSIONAL SEMICONDUCTOR PACKAGE AND METHOD FOR MANUFACTURING THREE-DIMENSIONAL SEMICONDUCTOR PACKAGE”. Wi... Read More
GENEVA, June 26 -- NTT DOCOMO, INC. filed a patent application (JP2024/043287) for “DEVICE FOR DETERMINING DISTRIBUTION OF HEADCOUNT AND METHOD FOR DETERMINING DISTRIBUTION OF HEADCOUNT”. With publica... Read More
GENEVA, June 26 -- NTT, INC. filed a patent application (JP2024/043288) for “SOFTNESS MEASUREMENT DEVICE AND SOFTNESS MEASUREMENT METHOD”. With publication no. WO/2026/120807, here are the other detai... Read More
GENEVA, June 26 -- NTT, INC. filed a patent application (JP2024/043252) for “TENSION MEASUREMENT METHOD, TENSION MEASUREMENT SYSTEM, AND TENSION REDUCTION METHOD”. With publication no. WO/2026/120800,... Read More
GENEVA, June 26 -- TOMODY, INC. filed a patent application (JP2024/043266) for “VIDEO CAPTURING DEVICE, VIDEO CAPTURING METHOD, AND PROGRAM”. With publication no. WO/2026/120803, here are the other de... Read More
GENEVA, June 26 -- RESONAC CORPORATION filed a patent application (JP2024/043285) for “METHOD FOR MANUFACTURING EVALUATION STRUCTURE AND METHOD FOR EVALUATING SEMICONDUCTOR DEVICE”. With publication n... Read More