ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,187, issued on May 12, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea) and Samsung SDI Co. Ltd. (Yongin-si, South Korea)... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,188, issued on May 12, was assigned to Briggs & Stratton LLC (Wauwatosa, Wis.). "User display for remaining runtime" was invented by Nichola... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,189, issued on May 12, was assigned to GS Yuasa International Ltd. (Kyoto, Japan). "Estimation device, estimation method, and computer progr... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,190, issued on May 12, was assigned to YAZAKI Corp. (Tokyo) and TOYOTA JIDOSHA K.K. (Toyota, Japan). "Voltage detection unit and power stora... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,191, issued on May 12, was assigned to Infineon Technologies AG (Neubiberg, Germany). "DC link capacitor charging and generating excitation ... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,192, issued on May 12, was assigned to LG ENERGY SOLUTION LTD. (Seoul, South Korea). "Device, system, and method for performance estimation ... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,193, issued on May 12, was assigned to TEXAS INSTRUMENTS Inc. (Dallas). "Droop compensation for device under test spectroscopy" was invented... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,194, issued on May 12, was assigned to NEXANS (Courbevoie, France). "Device and method for measuring space charge in an electric cable speci... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,195, issued on May 12, was assigned to GE Aviation Systems LLC (Grand Rapids, Ohio). "Multi-functional integrated testing system" was invent... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,196, issued on May 12, was assigned to SUMITOMO ELECTRIC INDUSTRIES LTD. (Osaka, Japan). "Detection apparatus and detection method" was inve... Read More