ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,514,132, issued on Dec. 30, was assigned to Taiwan Semiconductor Manufacturing Co. LTD. (Hsinchu, Taiwan). "Memory device with source lines in ... और पढ़ें
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,511,774, issued on Dec. 30, was assigned to Rakuten Group Inc. (Tokyo). "Image inference and verification apparatus, method, and computer-reada... और पढ़ें
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,513,465, issued on Dec. 30, was assigned to Huawei Technologies'Co.'Ltd.' (Shenzhen, China). "Method and apparatus for determining virtual spea... और पढ़ें
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,512,798, issued on Dec. 30, was assigned to Skyworks Solutions Inc. (Irvine, Calif.). "Pulse-width modulation audio amplifier having compensate... और पढ़ें
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,508,395, issued on Dec. 30, was assigned to Korrus Inc. (Los Angeles). "Circadian-friendly LED light sources" was invented by Michael R. Krames... और पढ़ें
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,507,719, issued on Dec. 30, was assigned to POTAMA Co. LTD. (Okinawa, Japan). "Jig for forming plate-shaped cooked rice and device for producin... और पढ़ें
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,508,132, issued on Dec. 30, was assigned to TORNIER SAS (Montbonnot-Saint-Martin, France). "Convertible stem/fracture stem" was invented by Pie... और पढ़ें
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,511,922, issued on Dec. 30, was assigned to Disney Enterprises Inc. (Burbank, Calif.). "Automated content analysis and annotation" was invented... और पढ़ें
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,511,013, issued on Dec. 30, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Electronic device for folder operation, and ... और पढ़ें
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,577, issued on Dec. 30, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich). "Testing system and method for testing devices under test" ... और पढ़ें