ALEXANDRIA, Va., June 2 -- United States Patent no. 12,643,151, issued on June 2, was assigned to Freeform Future Corp. (Hawthorne, Calif.). "Scheduling lasing tasks of a 3D printing system" was inve... Read More
ALEXANDRIA, Va., June 2 -- United States Patent no. 12,643,152, issued on June 2, was assigned to PRATT & WHITNEY CANADA CORP. (Longueuil, Canada). "Adaptive overhaul with two braze material and CT s... Read More
ALEXANDRIA, Va., June 2 -- United States Patent no. 12,645,197, issued on June 2, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Dynamic computer-based management of additive ... Read More
ALEXANDRIA, Va., June 2 -- United States Patent no. 12,645,199, issued on June 2, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo). "Numerical control device and numerical control method" was invent... Read More
ALEXANDRIA, Va., June 2 -- United States Patent no. 12,645,200, issued on June 2, was assigned to Gantri Inc. (San Leandro, Calif.). "Systems and methods for administering a 3D-printing-based manufac... Read More
ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,914, issued on June 2, was assigned to Telefonaktiebolaget LM Ericsson (Publ) (Stockholm). "Radio assembly comprising removable components a... Read More
ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,915, issued on June 2, was assigned to Franklin Sensors Inc. (Meridian, Idaho). "Apparatus, methods, and techniques of display for obscured ... Read More
ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,916, issued on June 2, was assigned to California Institute of Technology (Pasadena, Calif.). "Direct current-40 gigahertz coax-based cryoge... Read More
ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,917, issued on June 2. "Rig for comparing wire harnesses" was invented by Sandeep Suhas Patki (Pune, India). According to the abstract* rel... Read More
ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,918, issued on June 2, was assigned to b2 electronics GMbH (Klaus, Austria). "Testing device and method for testing a high or medium-voltage... Read More