US Patent Issued to Besi Switzerland on April 21 for "Apparatus and method for optical inspecting three or more sides of a component" (Swiss Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,568, issued on April 21, was assigned to Besi Switzerland AG (Steinhausen, Switzerland). "Apparatus and method for optical inspecting thre... Read More

US Patent Issued to DAIICHI JITSUGYO VISWILL on April 21 for "Visual inspection system for annular product" (Japanese Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,569, issued on April 21, was assigned to DAIICHI JITSUGYO VISWILL Co. LTD. (Osaka, Japan). "Visual inspection system for annular product" ... Read More

US Patent Issued to Carl Zeiss SMT on April 21 for "Sensor arrangement for arrangement on a measurement chamber, apparatus for qualifying a mask and method for qualifying a mask" (German Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,570, issued on April 21, was assigned to Carl Zeiss SMT GmbH (Oberkochen, Germany). "Sensor arrangement for arrangement on a measurement c... Read More

US Patent Issued to HITACHI ASTEMO on April 21 for "Visual inspection apparatus and visual inspection method" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,571, issued on April 21, was assigned to HITACHI ASTEMO LTD. (Ibaraki, Japan). "Visual inspection apparatus and visual inspection method" ... Read More

US Patent Issued to Square Robot on April 21 for "Systems, methods and apparatus for safe launch and recovery of an inspection vehicle" (Massachusetts, Maine Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,572, issued on April 21, was assigned to Square Robot Inc. (Marlborough, Mass.). "Systems, methods and apparatus for safe launch and recov... Read More

US Patent Issued to SAMSUNG ELECTRONICS on April 21 for "Defect inspection device and defect inspection method" (South Korean Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,573, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Defect inspection device and defect inspec... Read More

US Patent Issued to Renesas Electronics on April 21 for "Semiconductor device and physical quantity measuring device" (Japanese Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,574, issued on April 21, was assigned to Renesas Electronics Corp. (Tokyo). "Semiconductor device and physical quantity measuring device" ... Read More

US Patent Issued to PowerCo on April 21 for "Method for determining the placement accuracy of a plurality of electrode sheets in a stack" (German Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,575, issued on April 21, was assigned to PowerCo SE (Salzgitter, Germany). "Method for determining the placement accuracy of a plurality o... Read More

US Patent Issued to FEI on April 21 for "Augmentation of electron energy loss spectroscopy in charged particle microscopes" (Dutch Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,577, issued on April 21, was assigned to FEI Co. (Hillsboro, Ore.). "Augmentation of electron energy loss spectroscopy in charged particle... Read More

US Patent Issued to Illinois Tool Works on April 21 for "Accelerated higher resolution industrial radiography" (Minnesota Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,578, issued on April 21, was assigned to Illinois Tool Works Inc. (Glenview, Ill.). "Accelerated higher resolution industrial radiography"... Read More

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