US Patent Issued to Seoul National University R&DB Foundation on May 12 for "Method for manufacturing strain sensor by control of thin-film crack using stress concentration structure and strain sensor manufactured using same" (South Korean Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,938, issued on May 12, was assigned to Seoul National University R&DB Foundation (Seoul, South Korea). "Method for manufacturing strain sens... Read More

US Patent Issued to DR. JOHANNES HEIDENHAIN on May 12 for "Sensing element for an inductive angle measuring device" (German Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,939, issued on May 12, was assigned to DR. JOHANNES HEIDENHAIN GMBH (Traunreut, Germany). "Sensing element for an inductive angle measuring ... Read More

US Patent Issued to ASML Netherlands B. V. on May 12 for "Illumination source and associated metrology apparatus" (Dutch, Swedish Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,940, issued on May 12, was assigned to ASML Netherlands B. V. (Veldhoven, Netherlands). "Illumination source and associated metrology appara... Read More

US Patent Issued to Korea Institute of Machinery & Materials, KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY on May 12 for "Roller gap measurement system using light and roller gap measurement method using same" (South Korean Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,941, issued on May 12, was assigned to Korea Institute of Machinery & Materials (Daejeon, South Korea) and KOREA ADVANCED INSTITUTE OF SCIENC... Read More

US Patent Issued to AIPhotonics on May 12 for "Apparatus and method for quantifying the surface flatness of three-dimensional point cloud data" (Chinese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,942, issued on May 12, was assigned to AIPhotonics Ltd. (Hong Kong, Hong Kong). "Apparatus and method for quantifying the surface flatness o... Read More

US Patent Issued to YAMADA GIKEN on May 12 for "Piling snow depth measurement system" (Japanese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,943, issued on May 12, was assigned to YAMADA GIKEN Co. LTD. (Fukui City, Japan). "Piling snow depth measurement system" was invented by Tad... Read More

US Patent Issued to VHIVE TECH on May 12 for "Autonomous UAS data acquisition with context awareness" (Israeli Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,944, issued on May 12, was assigned to VHIVE TECH LTD (Herzliya, Israel). "Autonomous UAS data acquisition with context awareness" was inven... Read More

US Patent Issued to Trimble on May 12 for "Surveying target and method with light sector power optimization" (Swedish, French Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,945, issued on May 12, was assigned to Trimble Inc. (Westminster, Colo.). "Surveying target and method with light sector power optimization"... Read More

US Patent Issued to TOPCON on May 12 for "Surveying assistance device, surveying assistance system, surveying assistance method, and storage medium" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,946, issued on May 12, was assigned to TOPCON Corp. (Tokyo). "Surveying assistance device, surveying assistance system, surveying assistance... Read More

US Patent Issued to Groove UnLtd. on May 12 for "Point determination and projection device" (Maryland Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,624,947, issued on May 12, was assigned to Groove UnLtd. LLC (Taneytown, Md.). "Point determination and projection device" was invented by Micha... Read More

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