ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,502, issued on May 26, was assigned to ROHM Co. LTD. (Kyoto, Japan). "Semiconductor integrated circuit device and evaluation system" was inv... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,503, issued on May 26, was assigned to Google LLC (Mountain View, Calif.). "High-throughput scan architecture" was invented by Syed Shakir I... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,504, issued on May 26, was assigned to Samsung SDI Co. Ltd. (Yongin-si, South Korea). "Switch diagnostic device and battery pack including t... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,505, issued on May 26, was assigned to Otis Elevator Co. (Farmington, Conn.). "Device for testing function of contactors and apparatus for p... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,506, issued on May 26, was assigned to SIEMENS ENERGY GLOBAL GMBH & Co. KG (Munich). "Test system" was invented by Dennis Rotthaus (Dortmund... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,507, issued on May 26, was assigned to Nabtesco Corp. (Tokyo). "Automatic door maintenance support system, automatic door maintenance suppor... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,509, issued on May 26, was assigned to SHELL USA INC. (Houston). "Method for estimating the temperature rise rate of a battery under pulsed ... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,510, issued on May 26, was assigned to LG ENERGY SOLUTION LTD. (Seoul, South Korea). "Battery management apparatus and method" was invented ... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,511, issued on May 26, was assigned to CDO2 Ltd. (Mayfield, Great Britain) and The University of Sussex (Brighton, Great Britain). "Battery ... Read More
ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,512, issued on May 26, was assigned to LG ENERGY SOLUTION LTD. (Seoul, South Korea). "Low-voltage defect inspection method of lithium second... Read More