US Patent Issued to AMS INTERNATIONAL on April 21 for "Dynamic range extension of SPAD-based devices" (Dutch Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,503, issued on April 21, was assigned to AMS INTERNATIONAL AG (Jona, Switzerland). "Dynamic range extension of SPAD-based devices" was inv... Read More

US Patent Issued to SHENZHEN XPECTVISION TECHNOLOGY on April 21 for "Methods of operation of image sensor" (Chinese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,504, issued on April 21, was assigned to SHENZHEN XPECTVISION TECHNOLOGY Co. LTD. (Guangdong, China). "Methods of operation of image senso... Read More

US Patent Issued to SEIKO EPSON on April 21 for "Color measurement apparatus" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,505, issued on April 21, was assigned to SEIKO EPSON Corp. (Tokyo). "Color measurement apparatus" was invented by Katsumi Yamada (Matsumot... Read More

US Patent Issued to Seiko Epson on April 21 for "Color measuring system, backing plate, and color measuring apparatus" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,506, issued on April 21, was assigned to Seiko Epson Corp. (Tokyo). "Color measuring system, backing plate, and color measuring apparatus"... Read More

US Patent Issued to Purdue Research Foundation on April 21 for "Autonomous phenotype imaging system" (Indiana Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,507, issued on April 21, was assigned to Purdue Research Foundation (West Lafayette, Ind.). "Autonomous phenotype imaging system" was inve... Read More

US Patent Issued to MURATA MANUFACTURING on April 21 for "Piezoelectric interferometer" (Finnish Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,508, issued on April 21, was assigned to MURATA MANUFACTURING Co. LTD. (Nagaokakyo, Japan). "Piezoelectric interferometer" was invented by... Read More

US Patent Issued to MURATA MANUFACTURING on April 21 for "Interferometer with absorbing layer" (Finnish Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,509, issued on April 21, was assigned to MURATA MANUFACTURING Co. LTD. (Nagaokakyo, Japan). "Interferometer with absorbing layer" was inve... Read More

US Patent Issued to ANRITSU on April 21 for "Optical spectrum analyzer" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,510, issued on April 21, was assigned to ANRITSU Corp. (Kanagawa, Japan). "Optical spectrum analyzer" was invented by Maki Ueno (Kanagawa,... Read More

US Patent Issued to TSINGHUA UNIVERSITY, BEIJING SEETRUM TECHNOLOGY on April 21 for "Reconstruction method and device for spectral image" (Chinese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,511, issued on April 21, was assigned to TSINGHUA UNIVERSITY (Beijing) and BEIJING SEETRUM TECHNOLOGY Co. LTD. (Beijing). "Reconstruction ... Read More

US Patent Issued to THE UNIVERSITY OF TOKYO on April 21 for "Electronic state splitter for atoms, atom interferometer atomic transition frequency measurement device, atomic oscillator, optical lattice clock, quantum computer and method for generating superposition of electronic states of atoms" (Japanese Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,512, issued on April 21, was assigned to THE UNIVERSITY OF TOKYO (Tokyo). "Electronic state splitter for atoms, atom interferometer atomic... Read More

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