US Patent Issued to Taiwan Semiconductor Manufacturing on July 14 for "Clock generation circuits for memory devices with built-in self test" (Taiwanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,972, issued on July 14, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Clock generation circuits for memor... Read More

US Patent Issued to SambaNova Systems on July 14 for "Scannable memory subsystem" (Texas Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,973, issued on July 14, was assigned to SambaNova Systems Inc. (Palo Alto, Calif.). "Scannable memory subsystem" was invented by Thomas Zia... Read More

US Patent Issued to SambaNova Systems on July 14 for "Hybrid scan chains with flip-flops and latches" (Texas Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,974, issued on July 14, was assigned to SambaNova Systems Inc. (Palo Alto, Calif.). "Hybrid scan chains with flip-flops and latches" was in... Read More

US Patent Issued to SK hynix on July 14 for "Storage device for supporting dynamic allocation of memory and method of operating the same" (South Korean Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,975, issued on July 14, was assigned to SK hynix Inc. (Icheon-si, South Korea). "Storage device for supporting dynamic allocation of memory... Read More

US Patent Issued to Arm on July 14 for "Error detection" (British Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,976, issued on July 14, was assigned to Arm Ltd. (Cambridge, Great Britain). "Error detection" was invented by Christian Alex White (Burwel... Read More

US Patent Issued to XILINX on July 14 for "Memory lifecycle state sensors" (Alabama, New Mexico, California Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,977, issued on July 14, was assigned to XILINX INC. (San Jose, Calif.). "Memory lifecycle state sensors" was invented by James Anderson (Ma... Read More

US Patent Issued to Micron Technology on July 14 for "Self-calibration in a memory device" (Idaho, Pennsylvania Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,978, issued on July 14, was assigned to Micron Technology Inc. (Boise, Idaho). "Self-calibration in a memory device" was invented by Jennif... Read More

US Patent Issued to SAMSUNG ELECTRONICS, RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY on July 14 for "Memory device for supporting triple adjacent error detection, memory system having the same, and operating method thereof" (South Korean Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,979, issued on July 14, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Gyeonggi-do, South Korea) and RESEARCH & BUSINESS FOUNDATION SUNGKYUNK... Read More

US Patent Issued to Arm on July 14 for "Self-repair memory techniques" (French, American Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,980, issued on July 14, was assigned to Arm Ltd. (Cambridge, Great Britain). "Self-repair memory techniques" was invented by Edward Martin ... Read More

US Patent Issued to Ainnocence Technologies on July 14 for "Drug screening model construction method, a drug screening model construction device, a drug screening method, apparatus and a medium" (Chinese, American Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,981, issued on July 14, was assigned to Ainnocence Technologies LLC. "Drug screening model construction method, a drug screening model cons... Read More

• ««
• «
• 174077
• 174078
• 174079
• 174080
• 174081
• 174082
• 174083
• 174084
• 174085
• 174086
• »
• »»