INTERNATIONAL PATENT: NANOTRONICS IMAGING, INC. FILES APPLICATION FOR "LINE DEFECT DETECTION"

GENEVA, Sept. 3 -- NANOTRONICS IMAGING, INC. (2251 Front StreetSuite 110Cuyahoga Falls, OH 44223) filed a patent application (PCT/US2025/016828) for "LINE DEFECT DETECTION" on Feb 21, 2025. With publication no. WO/2025/179165, the details related to the patent application was published on Aug 28, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LEE, Joanna (2251 Front StreetSuite 110Cuyahoga Falls, OH 44223), KEITH, Jacob (2251 Front StreetSuite 110Cuyahoga Falls, OH 44223), DOSHI, Anuj (2251 Front StreetSuite 110Cuyahoga Falls, OH 44223)

Abstract: A computing system generates a training d...