US Patent Issued to Micron Technology on May 5 for "Adaptive temperature compensation for a memory device" (California, Colorado Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,447, issued on May 5, was assigned to Micron Technology Inc. (Boise, Idaho). "Adaptive temperature compensation for a memory device" was inve... Read More

US Patent Issued to SK hynix NAND Product Solutions on May 5 for "Solid state drive (SSD) with in-flight erasure iteration suspension" (California, Colorado Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,448, issued on May 5, was assigned to SK hynix NAND Product Solutions Corp. (Rancho Cordova, Calif.). "Solid state drive (SSD) with in-flight... Read More

US Patent Issued to Sandisk Technologies on May 5 for "Adaptive GIDL voltage for erasing non-volatile memory" (California Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,449, issued on May 5, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Adaptive GIDL voltage for erasing non-volatile memory" w... Read More

US Patent Issued to Sandisk Technologies on May 5 for "Aborted operation detection for nonvolatile memory with non-uniform erase" (American, Japanese Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,450, issued on May 5, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Aborted operation detection for nonvolatile memory with ... Read More

US Patent Issued to SAMSUNG ELECTRONICS on May 5 for "Memory system, debugging device, debugging method of memory system, and method of operating memory system" (South Korean Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,451, issued on May 5, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Memory system, debugging device, debugging metho... Read More

US Patent Issued to Micron Technology on May 5 for "Differential strobe fault identification" (Idaho, Minnesota Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,452, issued on May 5, was assigned to Micron Technology Inc. (Boise, Idaho). "Differential strobe fault identification" was invented by Scott... Read More

US Patent Issued to ONCOCROSS on May 5 for "Method, apparatus, and computer program for predicting interaction of compound and protein" (South Korean Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,453, issued on May 5, was assigned to ONCOCROSS Co. LTD. (Seoul, South Korea). "Method, apparatus, and computer program for predicting intera... Read More

US Patent Issued to The Regents of the University of California on May 5 for "BAMBAM: parallel comparative analysis of high-throughput sequencing data" (California Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,454, issued on May 5, was assigned to The Regents of the University of California (Oakland, Calif.). "BAMBAM: parallel comparative analysis o... Read More

US Patent Issued to Huawei Technologies'Co., 'Ltd.' on May 5 for "Merging duplicate marking to optimize computer operations for gene sequencing pipeline" (Canadian Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,455, issued on May 5, was assigned to Huawei Technologies'Co.'Ltd.' (Shenzhen, China). "Merging duplicate marking to optimize computer operat... Read More

US Patent Issued to Beijing Youzhuju Network Technology on May 5 for "Data processing method and apparatus for quantum chemistry system" (Chinese Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,456, issued on May 5, was assigned to Beijing Youzhuju Network Technology Co. Ltd. (Beijing). "Data processing method and apparatus for quant... Read More

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